X-ray reflectivity with a twist: Quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation

Magnetic X-ray Reflectivity

X-Ray and Neutron Reflectivity

re = 2.818 × 10−15m is the classical electron radius, ρe is the electron density of the material, and μx is the absorption length. With δ > 0 we find that n < 1, which leads to the phenomenon of so-called total external reflection for incident angles αi below the critical angle αc = √ 2δ. Typical values for δ are 10−5 . . . 10−6, and thus αc is in the range of 0.1 ◦ . . . 0.5◦. For simplicity, ...

Accuracy in x-ray reflectivity analysis

The influence of Poisson noise on the accuracy of x-ray reflectivity analysis is studied with an aluminium oxide (AlO) layer on silicon. A null hypothesis which argues that other than the exact solution gives the best fitness is examined with a statistical p-value test using a significance level of α = 0.01. Simulations are performed for a fit instead of a measurement since the exact error caus...

Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL.

This paper describes a method for rapid measurements of the specular X-ray reflectivity signal using an area detector and a monochromatic, well collimated X-ray beam (divergence below 0.01°), combined with a continuous data acquisition mode during the angular movements of the sample and detector. In addition to the total integrated (and background-corrected) reflectivity signal, this approach y...

Pore Characterization in low-k Dielectric Films using X-ray Reflectivity: X-ray Porosimetry

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